Università degli Studi di Cagliari
Carla Buosi
Counterfeit electronics in industry 4.0: risks and detection
2025-01-01 Mura, Giovanna; Carta, Simone; Montisci, Giorgio; Urru, Alessandro; Musa, Michela; Andronico, Pietro
Electronics authentication using electrical measurements and machine learning
2025-01-01 Carta, S.; Urru, A.; Musa, M.; Andronico, P.; Mura, G.
Enhancing high-frequency RFID sensing through PEDOT-enabled technologies
2025-01-01 Casula, G. A.; Cosseddu, P.; Mascia, A.; Sforazzini, G.; Montisci, G.; Mura, G.; Mattana, E.; Maxia, P.
Catastrophic degradation of LEDs: failure analysis and perspective
2025-01-01 Trivellin, N.; Caria, A.; Huang, A.; Piva, F.; Buffolo, M.; De Santi, C.; Magnien, J.; Rosc, J.; Mura, G.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
Non-destructive detection of counterfeit audio amplifier modules
2025-01-01 Carta, Simone; Mura, Giovanna
Enhancing Thermal and Radiation Hardness of All-Organic Printed Transistors by a Flexible and Transparent Encapsulation Layer for Low Earth Orbit Applications
2025-01-01 Casula, G.; Ricci, P. C.; Cosseddu, P.; Mura, G.; Lai, S.
Detecting counterfeit electronic circuits: the effect of PCB thickness and dielectric permittivity on the electromagnetic fingerprint
2025-01-01 Mura, G.; Muntoni, G.; Casula, G. A.; Mattana, E.; Ortu, P.; Pilia, S.; Andronico, P.; Montisci, G.
Counterfeit electronics: A threat for new space economy
2025-01-01 Mura, Giovanna
Defects in InGaN QW structures: microscopic properties and modeling
2025-01-01 Meneghini, M.; Nicoletto, M.; Piva, F.; Roccato, N.; Caria, A.; Rampazzo, F.; De Santi, C.; Buffolo, M.; Rossi, F.; Mura, G.; Gasparotto, A.; Becht, C.; Kusch, G.; Ji, Y.; Huang, X.; Fu, H.; Chen, H.; Zhao, Y.; Trivellin, N.; Meneghesso, G.; Zanoni, E.; Oliver, R.; Grandjean, N.; Schwarz, U. T.
Counterfeit electronics detection via physical analysis
2024-01-01 Carta, Simone; Mura, Giovanna
Robustness and reliability of high-power white LEDs under high-temperature, high-current stress
2024-01-01 Caria, Alessandro; Fraccaroli, Riccardo; Pierobon, Giulia; Castellaro, Thomas; Mura, Giovanna; Ricci, Pier Carlo; De Santi, Carlo; Buffolo, Matteo; Trivellin, Nicola; Zanoni, Enrico; Meneghesso, Gaudenzio; Meneghini, Matteo
Evaluation of flexible organic transistor stability in harsh conditions
2024-01-01 Casula, G.; Ricci, P. C.; Mura, G.; Lai, S.
The threat of counterfeit electronics to the development of CubeSats
2024-01-01 Mura, Giovanna
Influence of V-pits on the electro-optical properties of high-periodicity InGaN MQWs
2024-01-01 Nicoletto, Marco; Caria, Alessandro; Rampazzo, Fabiana; De Santi, Carlo; Buffolo, Matteo; Mura, Giovanna; Rossi, Francesca; Huang, Xuanqi; Fu, Houqiang; Chen, Hong; Zhao, Yuji; Meneghesso, Gaudenzio; Zanoni, Enrico; Meneghini, Matteo
Electronic components authentication via physical analysis
2023-01-01 Mura, G.; Carta, S.; Ricci, P. C.; Martines, G.
A Curved Microstrip Patch Antenna Designed From Transparent Conductive Films
2023-01-01 Montisci, G.; Mura, G.; Muntoni, G.; Casula, G. A.; Chietera, F. P.; Aburish-Hmidat, M.
A transparent curved microstrip patch antenna
2023-01-01 Muntoni, G.; Mura, G.; Casula, G. A.; Chietera, F. P.; Aburish-Hmidat, M.; Montisci, G.
Influence of V-Pits on the Turn-On Voltage of GaN-Based High Periodicity Multiple Quantum Well Solar Cells
2023-01-01 Nicoletto, M.; Caria, A.; Rampazzo, F.; De Santi, C.; Buffolo, M.; Mura, G.; Rossi, F.; Huang, X.; Fu, H.; Chen, H.; Zhao, Y.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
Early failure of high-power white LEDs for outdoor applications under extreme electrical stress: role of silicone encapsulant
2023-01-01 Caria, A; Fraccaroli, R; Pierobon, G; Castellaro, T; Mura, G; Ricci, Pc; De Santi, C; Buffolo, M; Trivellin, N; Zanoni, E; Meneghesso, G; Meneghini, M
Reliability risks from counterfeit electronics
2022-01-01 Mura, Giovanna; Martines, Giovanni
Laser Diode Reliability
2021-01-01 Mura, Giovanna; Mitsuo, Fukuda
Vertical assisted directional-coupler from Silicon-on-Insulator to Silicon Nitride platforms
2021-01-01 Zagaglia, Luca; Argiolas, Simone; Iadanza, Simone; Mura, Giovanna; Floris, Francesco; O’Brien, Peter
Analysis of Fake Amplifiers
2021-01-01 Mura, G.; Murru, R.; Martines, G.
CUBESATS: PAVING THE WAY TOWARDS AN EFFECTIVE RELIABILITY – ORIENTED APPROACH
2021-01-01 Mura, Giovanna; Fois, Gabriele
CdTe solar cells: technology, operation and reliability
2021-01-01 Barbato, M.; Artegiani, E.; Bertoncello, M.; Meneghini, M.; Trivellin, N.; Mantoan, E.; Romeo, A.; Mura, G.; Ortolani, L.; Zanoni, E.; Meneghesso, G.
Laser diode DC measurement protocols
2021-01-01 Vanzi, M.; Mura, G.; Bechou, L.; Marcello, G.; Sanna Valle, V.
Peculiar failure mechanisms in GaN power transistors
2020-01-01 Vanzi, M.; Mura, G.
Analysis of counterfeit electronics
2020-01-01 Mura, G.; Murru, R.; Martines, G.
Optical gain in laser diodes with null reflectivity
2019-01-01 Vanzi, M.; Mura, G.; Rampulla, A.; Marchetti, R.; Sanna Valle, V.; Uenoc, Y.
New paradigm for EBIC amplifier on FIB X-section
2019-01-01 SANNA VALLE, Valerio; Perez, Guy; Bascoul, Guillaume; Chauvin, Helene; Viallet, Benoît; Mura, Giovanna; Apeddu, GIAN PAOLO
Further improvements of an extended Hakki-Paoli method
2018-01-01 Vanzi, M.; Mura, G.; Martines, G.
Catastrophic Optical Damage of GaN-Based Diode Lasers: Sequence of Events, Damage Pattern, and Comparison with GaAs-Based Devices
2018-01-01 Tomm, Jens W.; Kernke, Robert; Mura, Giovanna; Vanzi, Massimo; Hempel, Martin; Acklin, Bruno
From automotive to space qualification: Overlaps, gaps and possible convergence
2018-01-01 Vaion, R. Enrici; Medda, M.; Mancaleoni, A.; Mura, G.
Optical gain beyond Hakki-Paoli. a new power tool for reliability of laser diodes
2018-01-01 Vanzi, M.; Mura, G.; SANNA VALLE, Valerio
Reliability concerns from the gray market
2018-01-01 Mura, Giovanna
Comparison of catastrophic optical damage events in GaAs- and GaN-based diode lasers
2017-01-01 Tomm, J. W.; Kernke, R.; Mura, G.; Vanzi, M.; Hempel, M.
Analytical model for the I-V characteristics of fresh and degraded commercial LEDs
2017-01-01 Mura, G.; MIRANDA CASTELLANO, ENRIQUE ALBERTO
Qualification extension of automotive smart power and digital ICs to harsh aerospace mission profiles: Gaps and opportunities
2017-01-01 Enrici Vaion, R.; Medda, M.; Mancaleoni, A.; Mura, G.; Pintus, A.; De Tomasi, M.
Extended Modal Gain Measurement in DFB Laser Diodes
2017-01-01 Vanzi, Massimo; Marcello, Giulia; Mura, Giovanna; Le Gales, G; Joly, S; Deshayes, Y; Bechou, L.
Practical optical gain by an extended Hakki-Paoli method
2017-01-01 Vanzi, M.; Marcello, G.; Mura, G.; Le Galès, G.; Joly, S.; Deshayes, Y.; Bechou, L.
Analysis of GaN based high-power diode lasers after singular degradation events
2017-01-01 Mura, G.; Vanzi, M.; Hempel, M.; Tomm, J. W.
ESD tests on 850 nm GaAs-based VCSELs
2016-01-01 Vanzi, Massimo; Mura, Giovanna; Marcello, Giulia; Xiao, K.
Reverse bias degradation of metal wrap through silicon solar cells
2016-01-01 Barbato, M.; Barbato, A.; Meneghini, M.; Cester, A.; Mura, Giovanna; Tonini, D.; Voltan, A.; Cellere, G.; Meneghesso, G.
Logics of Failure Analysis: 20 Years of rules of the Rue Morgue
2016-01-01 Mura, Giovanna; Vanzi, Massimo
Side-Mode Excitation in Single-Mode Laser Diodes
2016-01-01 Vanzi, Massimo; Xiao, K.; Marcello, Giulia; Mura, Giovanna
Single Event Transient acquisition and mapping for space device Characterization
2016-01-01 Pilia, Roberta; Bascoul, Guillaume; Sanchez, Kevin; Mura, Giovanna; Infante, Fulvio
Nanoscale Investigation of Degradation and Wavelength Fluctuations in InGaN-Based Green Laser Diodes
2016-01-01 De Santi, Carlo; Meneghini, Matteo; Gachet, David; Mura, Giovanna; Vanzi, Massimo; Meneghesso, Gaudenzio; Zanoni, Enrico
Proton irradiation effects on commercial laser diodes
2015-01-01 Marcello, Giulia; Mura, Giovanna; Vanzi, Massimo; Bagatin, Marta; Gerardin, Simone; Paccagnella, Alessandro
Stress-induced instabilities of shunt paths in high efficiency MWT solar cells
2015-01-01 Barbato, M.; Meneghini, M.; Cester, A.; Barbato, A.; Zanoni, E.; Meneghesso, G.; Mura, Giovanna; Tonini, D.; Voltan, A.; Cellere, G.
Degradation mechanisms and lifetime of state-of-the-art green laser diodes
2015-01-01 Marioli, M; Meneghini, M; Rossi, F; Salviati, G; de Santi, C; Mura, Giovanna; Meneghesso, G; Zanoni, E.
| Titolo | Data di pubblicazione | Autore(i) | Rivista | Editore |
|---|---|---|---|---|
| Counterfeit electronics in industry 4.0: risks and detection | 1-gen-2025 | Mura, Giovanna; Carta, Simone; Montisci, Giorgio; Urru, Alessandro; Musa, Michela; Andronico, Pietro | - | RESEARCH PUBLISHING |
| Electronics authentication using electrical measurements and machine learning | 1-gen-2025 | Carta, S.; Urru, A.; Musa, M.; Andronico, P.; Mura, G. | MICROELECTRONICS RELIABILITY | - |
| Enhancing high-frequency RFID sensing through PEDOT-enabled technologies | 1-gen-2025 | Casula, G. A.; Cosseddu, P.; Mascia, A.; Sforazzini, G.; Montisci, G.; Mura, G.; Mattana, E.; Maxia, P. | - | IEEE |
| Catastrophic degradation of LEDs: failure analysis and perspective | 1-gen-2025 | Trivellin, N.; Caria, A.; Huang, A.; Piva, F.; Buffolo, M.; De Santi, C.; Magnien, J.; Rosc, J.; Mura, G.; Meneghesso, G.; Zanoni, E.; Meneghini, M. | - | IEEE |
| Non-destructive detection of counterfeit audio amplifier modules | 1-gen-2025 | Carta, Simone; Mura, Giovanna | - | IEEE |
| Enhancing Thermal and Radiation Hardness of All-Organic Printed Transistors by a Flexible and Transparent Encapsulation Layer for Low Earth Orbit Applications | 1-gen-2025 | Casula, G.; Ricci, P. C.; Cosseddu, P.; Mura, G.; Lai, S. | PHYSICA STATUS SOLIDI. A, APPLICATIONS AND MATERIALS SCIENCE | - |
| Detecting counterfeit electronic circuits: the effect of PCB thickness and dielectric permittivity on the electromagnetic fingerprint | 1-gen-2025 | Mura, G.; Muntoni, G.; Casula, G. A.; Mattana, E.; Ortu, P.; Pilia, S.; Andronico, P.; Montisci, G. | IEEE SENSORS JOURNAL | - |
| Counterfeit electronics: A threat for new space economy | 1-gen-2025 | Mura, Giovanna | - | - |
| Defects in InGaN QW structures: microscopic properties and modeling | 1-gen-2025 | Meneghini, M.; Nicoletto, M.; Piva, F.; Roccato, N.; Caria, A.; Rampazzo, F.; De Santi, C.; Buffolo, M.; Rossi, F.; Mura, G.; Gasparotto, A.; Becht, C.; Kusch, G.; Ji, Y.; Huang, X.; Fu, H.; Chen, H.; Zhao, Y.; Trivellin, N.; Meneghesso, G.; Zanoni, E.; Oliver, R.; Grandjean, N.; Schwarz, U. T. | - | SPIE |
| Counterfeit electronics detection via physical analysis | 1-gen-2024 | Carta, Simone; Mura, Giovanna | - | ESREL |
| Robustness and reliability of high-power white LEDs under high-temperature, high-current stress | 1-gen-2024 | Caria, Alessandro; Fraccaroli, Riccardo; Pierobon, Giulia; Castellaro, Thomas; Mura, Giovanna; Ricci, Pier Carlo; De Santi, Carlo; Buffolo, Matteo; Trivellin, Nicola; Zanoni, Enrico; Meneghesso, Gaudenzio; Meneghini, Matteo | - | SPIE |
| Evaluation of flexible organic transistor stability in harsh conditions | 1-gen-2024 | Casula, G.; Ricci, P. C.; Mura, G.; Lai, S. | - | IEEE |
| The threat of counterfeit electronics to the development of CubeSats | 1-gen-2024 | Mura, Giovanna | - | Croatian Society Electronics in Marine - ELMAR; IEEE |
| Influence of V-pits on the electro-optical properties of high-periodicity InGaN MQWs | 1-gen-2024 | Nicoletto, Marco; Caria, Alessandro; Rampazzo, Fabiana; De Santi, Carlo; Buffolo, Matteo; Mura, Giovanna; Rossi, Francesca; Huang, Xuanqi; Fu, Houqiang; Chen, Hong; Zhao, Yuji; Meneghesso, Gaudenzio; Zanoni, Enrico; Meneghini, Matteo | - | SPIE-INT SOC OPTICAL ENGINEERING |
| Electronic components authentication via physical analysis | 1-gen-2023 | Mura, G.; Carta, S.; Ricci, P. C.; Martines, G. | - | IEEE (EDS) |
| A Curved Microstrip Patch Antenna Designed From Transparent Conductive Films | 1-gen-2023 | Montisci, G.; Mura, G.; Muntoni, G.; Casula, G. A.; Chietera, F. P.; Aburish-Hmidat, M. | IEEE ACCESS | - |
| A transparent curved microstrip patch antenna | 1-gen-2023 | Muntoni, G.; Mura, G.; Casula, G. A.; Chietera, F. P.; Aburish-Hmidat, M.; Montisci, G. | - | Institute of Electrical and Electronics Engineers |
| Influence of V-Pits on the Turn-On Voltage of GaN-Based High Periodicity Multiple Quantum Well Solar Cells | 1-gen-2023 | Nicoletto, M.; Caria, A.; Rampazzo, F.; De Santi, C.; Buffolo, M.; Mura, G.; Rossi, F.; Huang, X.; Fu, H.; Chen, H.; Zhao, Y.; Meneghesso, G.; Zanoni, E.; Meneghini, M. | IEEE JOURNAL OF PHOTOVOLTAICS | - |
| Early failure of high-power white LEDs for outdoor applications under extreme electrical stress: role of silicone encapsulant | 1-gen-2023 | Caria, A; Fraccaroli, R; Pierobon, G; Castellaro, T; Mura, G; Ricci, Pc; De Santi, C; Buffolo, M; Trivellin, N; Zanoni, E; Meneghesso, G; Meneghini, M | MICROELECTRONICS RELIABILITY | - |
| Reliability risks from counterfeit electronics | 1-gen-2022 | Mura, Giovanna; Martines, Giovanni | - | IEEE |
| Laser Diode Reliability | 1-gen-2021 | Mura, Giovanna; Mitsuo, Fukuda | - | ISTE Press Ltd. - Elsevier |
| Vertical assisted directional-coupler from Silicon-on-Insulator to Silicon Nitride platforms | 1-gen-2021 | Zagaglia, Luca; Argiolas, Simone; Iadanza, Simone; Mura, Giovanna; Floris, Francesco; O’Brien, Peter | - | - |
| Analysis of Fake Amplifiers | 1-gen-2021 | Mura, G.; Murru, R.; Martines, G. | - | IEEE |
| CUBESATS: PAVING THE WAY TOWARDS AN EFFECTIVE RELIABILITY – ORIENTED APPROACH | 1-gen-2021 | Mura, Giovanna; Fois, Gabriele | - | AIT Series Trends in earth observation Volume 2 |
| CdTe solar cells: technology, operation and reliability | 1-gen-2021 | Barbato, M.; Artegiani, E.; Bertoncello, M.; Meneghini, M.; Trivellin, N.; Mantoan, E.; Romeo, A.; Mura, G.; Ortolani, L.; Zanoni, E.; Meneghesso, G. | JOURNAL OF PHYSICS D. APPLIED PHYSICS | - |
| Laser diode DC measurement protocols | 1-gen-2021 | Vanzi, M.; Mura, G.; Bechou, L.; Marcello, G.; Sanna Valle, V. | - | ISTE Press - Elsevier |
| Peculiar failure mechanisms in GaN power transistors | 1-gen-2020 | Vanzi, M.; Mura, G. | MICROELECTRONICS RELIABILITY | - |
| Analysis of counterfeit electronics | 1-gen-2020 | Mura, G.; Murru, R.; Martines, G. | MICROELECTRONICS RELIABILITY | - |
| Optical gain in laser diodes with null reflectivity | 1-gen-2019 | Vanzi, M.; Mura, G.; Rampulla, A.; Marchetti, R.; Sanna Valle, V.; Uenoc, Y. | MICROELECTRONICS RELIABILITY | - |
| New paradigm for EBIC amplifier on FIB X-section | 1-gen-2019 | SANNA VALLE, Valerio; Perez, Guy; Bascoul, Guillaume; Chauvin, Helene; Viallet, Benoît; Mura, Giovanna; Apeddu, GIAN PAOLO | - | - |
| Further improvements of an extended Hakki-Paoli method | 1-gen-2018 | Vanzi, M.; Mura, G.; Martines, G. | MICROELECTRONICS RELIABILITY | - |
| Catastrophic Optical Damage of GaN-Based Diode Lasers: Sequence of Events, Damage Pattern, and Comparison with GaAs-Based Devices | 1-gen-2018 | Tomm, Jens W.; Kernke, Robert; Mura, Giovanna; Vanzi, Massimo; Hempel, Martin; Acklin, Bruno | JOURNAL OF ELECTRONIC MATERIALS | - |
| From automotive to space qualification: Overlaps, gaps and possible convergence | 1-gen-2018 | Vaion, R. Enrici; Medda, M.; Mancaleoni, A.; Mura, G. | - | IEEE (Institute of Electrical and Electronics Engineers) |
| Optical gain beyond Hakki-Paoli. a new power tool for reliability of laser diodes | 1-gen-2018 | Vanzi, M.; Mura, G.; SANNA VALLE, Valerio | - | SPIE |
| Reliability concerns from the gray market | 1-gen-2018 | Mura, Giovanna | MICROELECTRONICS RELIABILITY | - |
| Comparison of catastrophic optical damage events in GaAs- and GaN-based diode lasers | 1-gen-2017 | Tomm, J. W.; Kernke, R.; Mura, G.; Vanzi, M.; Hempel, M. | - | IEEE (Institute of Electrical and Electronics Engineers) |
| Analytical model for the I-V characteristics of fresh and degraded commercial LEDs | 1-gen-2017 | Mura, G.; MIRANDA CASTELLANO, ENRIQUE ALBERTO | - | - |
| Qualification extension of automotive smart power and digital ICs to harsh aerospace mission profiles: Gaps and opportunities | 1-gen-2017 | Enrici Vaion, R.; Medda, M.; Mancaleoni, A.; Mura, G.; Pintus, A.; De Tomasi, M. | MICROELECTRONICS RELIABILITY | - |
| Extended Modal Gain Measurement in DFB Laser Diodes | 1-gen-2017 | Vanzi, Massimo; Marcello, Giulia; Mura, Giovanna; Le Gales, G; Joly, S; Deshayes, Y; Bechou, L. | IEEE PHOTONICS TECHNOLOGY LETTERS | - |
| Practical optical gain by an extended Hakki-Paoli method | 1-gen-2017 | Vanzi, M.; Marcello, G.; Mura, G.; Le Galès, G.; Joly, S.; Deshayes, Y.; Bechou, L. | MICROELECTRONICS RELIABILITY | - |
| Analysis of GaN based high-power diode lasers after singular degradation events | 1-gen-2017 | Mura, G.; Vanzi, M.; Hempel, M.; Tomm, J. W. | PHYSICA STATUS SOLIDI. RAPID RESEARCH LETTERS | - |
| ESD tests on 850 nm GaAs-based VCSELs | 1-gen-2016 | Vanzi, Massimo; Mura, Giovanna; Marcello, Giulia; Xiao, K. | MICROELECTRONICS RELIABILITY | - |
| Reverse bias degradation of metal wrap through silicon solar cells | 1-gen-2016 | Barbato, M.; Barbato, A.; Meneghini, M.; Cester, A.; Mura, Giovanna; Tonini, D.; Voltan, A.; Cellere, G.; Meneghesso, G. | SOLAR ENERGY MATERIALS AND SOLAR CELLS | - |
| Logics of Failure Analysis: 20 Years of rules of the Rue Morgue | 1-gen-2016 | Mura, Giovanna; Vanzi, Massimo | - | Institute of Electrical and Electronics Engineers Inc. |
| Side-Mode Excitation in Single-Mode Laser Diodes | 1-gen-2016 | Vanzi, Massimo; Xiao, K.; Marcello, Giulia; Mura, Giovanna | IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY | - |
| Single Event Transient acquisition and mapping for space device Characterization | 1-gen-2016 | Pilia, Roberta; Bascoul, Guillaume; Sanchez, Kevin; Mura, Giovanna; Infante, Fulvio | MICROELECTRONICS RELIABILITY | - |
| Nanoscale Investigation of Degradation and Wavelength Fluctuations in InGaN-Based Green Laser Diodes | 1-gen-2016 | De Santi, Carlo; Meneghini, Matteo; Gachet, David; Mura, Giovanna; Vanzi, Massimo; Meneghesso, Gaudenzio; Zanoni, Enrico | IEEE TRANSACTIONS ON NANOTECHNOLOGY | - |
| Proton irradiation effects on commercial laser diodes | 1-gen-2015 | Marcello, Giulia; Mura, Giovanna; Vanzi, Massimo; Bagatin, Marta; Gerardin, Simone; Paccagnella, Alessandro | - | Institute of Electrical and Electronics Engineers Inc. |
| Stress-induced instabilities of shunt paths in high efficiency MWT solar cells | 1-gen-2015 | Barbato, M.; Meneghini, M.; Cester, A.; Barbato, A.; Zanoni, E.; Meneghesso, G.; Mura, Giovanna; Tonini, D.; Voltan, A.; Cellere, G. | - | - |
| Degradation mechanisms and lifetime of state-of-the-art green laser diodes | 1-gen-2015 | Marioli, M; Meneghini, M; Rossi, F; Salviati, G; de Santi, C; Mura, Giovanna; Meneghesso, G; Zanoni, E. | PHYSICA STATUS SOLIDI. A, APPLICATIONS AND MATERIALS SCIENCE | - |
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