Szoke Veronka
UniCa About Professors and Researchers Veronka Szoke Research Research outcomes (IRIS)

Veronka Szoke

Electronic components authentication via physical analysis

Mura G.
First
;Carta S.;Ricci P. C.;Martines G.
2023-01-01

Abstract

Counterfeit electronics is a reliability problem. Undetected counterfeits can lead to increased scrap rates, early field failures, and rework rates, causing a dramatic reduction in the reliability of systems. Identifying counterfeit devices can be challenging because not everything that seems suspect is necessarily fake. On the other hand, counterfeiters keep growing and adapting.
2023
Inglese
2023 IEEE 33rd International Conference on Microelectronics, MIEL 2023
979-8-3503-4776-0
IEEE (EDS)
4
2-s2.0-85181200655
2023 IEEE 33rd International Conference on Microelectronics, MIEL 2023
Esperti anonimi
16- 18 October 2023
Nis, Serbia
internazionale
scientifica
Crime; % reductions; Electronic component; Field failure; Physical analysis; Reliability problems; Scrap rate
Goal 12: Responsible consumption and production
no
4 Contributo in Atti di Convegno (Proceeding)::4.1 Contributo in Atti di convegno
Mura, G.; Carta, S.; Ricci, P. C.; Martines, G.
273
4
4.1 Contributo in Atti di convegno
partially_open
info:eu-repo/semantics/conferencePaper
Files in This Item:
File Size Format  
Electronic_Components_Authentication_via_Physical_Analysis.pdf

Solo gestori archivio

Description: VoR
Type: versione editoriale
Size 1.21 MB
Format Adobe PDF
& nbsp; View / Open   Request a copy
1.21 MB Adobe PDF & nbsp; View / Open   Request a copy
MIEL2023_ID66_final_iris.pdf

open access

Description: AAM
Type: Author’s Accepted Manuscript AAM, Post-print, (version accepted by the publisher)
Size 615.25 kB
Format Adobe PDF
View/Open
615.25 kB Adobe PDF View/Open

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

Questionnaire and social

Share on:
Impostazioni cookie